TRAINING CONTACTS
| Equipment | Contact |
| Baush & Lomb SEM | Dan Marshall, (778) 782-5474 |
| Strata DB235 FESEM/FIB | Li Yang, (778) 782-3812 |
| Hitachi 8000 STEM | Karen Kavanagh, (778) 782-4244 |
| Tecnai G2 STEM | Li Yang, (778) 782-3812 |
| Park Scientific AFM | Simon Watkins, (778) 782-5763 |
| Thermal Microscope SPM | Gary Leach, (778) 782-8065 |
Guide to Electron Microscope Training and Access
New Users:
- Classification: New users to the 4D LABS Nanoimaging Facility are first classified based on the following criteria:
- The instrument that they hope to use: SEM (DB, BLN), and or STEM (Tecnai, Hitachi).
- Their level of background knowledge and experience with the techniques required: novice, intermediate, or expert.
- Discussion of Research Plan: In order to proceed with the appropriate (and required) training it is important that a brief research plan be discussed with Li Yang. A new user should provide a brief description of what they would like to find out, and from what kind of material or device. This process might be completed with the help of their research supervisor. This research plan will permit advice or feedback about whether the proposed project is feasible with the instruments located in the facility.
A second issue is whether the samples to be investigated require preparation prior to using the instruments. Some sample preparation techniques are offered within the Nanoimaging facility. Users should have a plan for how are they going to prepare their samples for SEM or STEM analysis.
- Training: Li Yang will supervise the training of any new user until they are to a level where they can operate the instrument without supervision for the techniques they require. The time required to reach this level of skill depends on the prior experience of the new user and their ability to demonstrate independence and understanding of the techniques.
Levels:
- SEM:
-
Li Yang will work with all new users initially. The time required to become an independent user of the SEM will depend on the prior level of experience of the new user.
-
Basic SEM:
- A typical new novice user will take about 3 hours of training and supervision before they develop the necessary skills to operate independently. Those with prior experience on another SEM may take much less time.
-
Advanced SEM
-
- EDS: If a qualified SEM user wishes to also use EDS analysis the required training typically takes 1 more hour.
- FIB: Training on the effective usage of the FIB can take an additional day or longer depending on the level of experience of the new user. Only qualified SEM users will be trained to use the FIB.
S/TEM:
Similar to the SEM Li Yang will work with all new users of the STEM.
- Experienced TEM users:
- For those who have already had hands-on experience using another TEM a 3 hour training period to become familiar with the particular operation of the Tecnai is usually sufficient to allow independent operation. Otherwise, training time on the H8000 is necessary.
- Novice Users:
- All novice users are required to spend at least 10 hours on the H8000 STEM before being trained on the Tecnai. The training of a completely novice user for simple tasks in S/TEM is much more time consuming than for SEM general training. Without prior study and practice a new user of any TEM will not be an effective user of the instrument and will not progress in their abilities.
- Basic TEM skills:
- Basic concepts required to produce the simplest TEM images. Understanding the nature of bright field (BF), dark field (DF), and diffraction modes of operation. These skills are to be first learned and demonstrated on the H8000 and then on the Tecnai, if that instrument is required to achieve the userŐs goals.
- Basic STEM skills:
- Basic operation of the Tecnai scanning TEM including HAADF, and EDS. Prerequisite is demonstration of basic TEM qualifications.
- Advanced STEM skills:
- With the above experience the advanced user can proceed to also learn EELS, EFTEM, electron holography, and Lorentz microscopy if required.
Requirements for Independent SEM or STEM operation:
- Sufficient knowledge of the basic operating procedures including sample preparation, installation of samples into the machine, focusing the electron beam and stage control, image acquisition, data transfer and analysis, sample removal, and proper logoff.
- Demonstrated responsible and careful following of operating procedures described in the instructions associated with the instrument, such that Li Yang is confident that the person in question is an effective and safe user of the instrument.
- The instrument that they hope to use: SEM (DB, BLN), and or STEM (Tecnai, Hitachi).
- Their level of background knowledge and experience with the techniques required: novice, intermediate, or expert.
A second issue is whether the samples to be investigated require preparation prior to using the instruments. Some sample preparation techniques are offered within the Nanoimaging facility. Users should have a plan for how are they going to prepare their samples for SEM or STEM analysis.
Levels:
- SEM:
- Li Yang will work with all new users initially. The time required to become an independent user of the SEM will depend on the prior level of experience of the new user.
- Basic SEM:
- A typical new novice user will take about 3 hours of training and supervision before they develop the necessary skills to operate independently. Those with prior experience on another SEM may take much less time.
- Advanced SEM
-
- EDS: If a qualified SEM user wishes to also use EDS analysis the required training typically takes 1 more hour.
- FIB: Training on the effective usage of the FIB can take an additional day or longer depending on the level of experience of the new user. Only qualified SEM users will be trained to use the FIB.
S/TEM:
Similar to the SEM Li Yang will work with all new users of the STEM.
- Experienced TEM users:
- For those who have already had hands-on experience using another TEM a 3 hour training period to become familiar with the particular operation of the Tecnai is usually sufficient to allow independent operation. Otherwise, training time on the H8000 is necessary.
- Novice Users:
- All novice users are required to spend at least 10 hours on the H8000 STEM before being trained on the Tecnai. The training of a completely novice user for simple tasks in S/TEM is much more time consuming than for SEM general training. Without prior study and practice a new user of any TEM will not be an effective user of the instrument and will not progress in their abilities.
- Basic TEM skills:
- Basic concepts required to produce the simplest TEM images. Understanding the nature of bright field (BF), dark field (DF), and diffraction modes of operation. These skills are to be first learned and demonstrated on the H8000 and then on the Tecnai, if that instrument is required to achieve the userŐs goals.
- Basic STEM skills:
- Basic operation of the Tecnai scanning TEM including HAADF, and EDS. Prerequisite is demonstration of basic TEM qualifications.
- Advanced STEM skills:
- With the above experience the advanced user can proceed to also learn EELS, EFTEM, electron holography, and Lorentz microscopy if required.
- Sufficient knowledge of the basic operating procedures including sample preparation, installation of samples into the machine, focusing the electron beam and stage control, image acquisition, data transfer and analysis, sample removal, and proper logoff.
- Demonstrated responsible and careful following of operating procedures described in the instructions associated with the instrument, such that Li Yang is confident that the person in question is an effective and safe user of the instrument.