Shown in the image is the Hitachi 8100 scanning transmission electron microscope (STEM), a general purpose analytical microscope useful for materials science. It has a maximum accelerating voltage of 200 keV with a point (lattice) resolution of 0.25 nm (0.14 nm) operating with a LaB6 filament. The sample is mounted through a side entry goniometer stage capable of 40 degrees rotation. There are both single and double tilt holders available. TEM data is extracted through a film cassette. The scanning system interfaces to a CRT screen and Polaroid film. There is an energy dispersive x-ray detector for compositional analysis. LOCATION: Shrum Science Center Rm P8426, Phone: 291-4082