FEI Dualbeam Field-Emission SEM with
Focused Ion Beam |
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Our newest scanning electron microscope is an FEI DualBeam Strata 235 that includes both an SEM and a
Focused Ion Beam together with an EDAX X-ray analyzer.
This instrument will allow regular SEM imaging and x-ray analysis plus the capability to ion mill the sample with the FIB. The sample can be cross-sectioned for SEM or STEM imaging or patterned into nanostructures for other applications.
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Features:
X-ray analyzer (EDAX) Analysis
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Full Spectrum Mapping & Data Recovery
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automated quantitative elemental analysis
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live
spectral collection, spectral manipulation, Peak ID, background removal, and intensity and
concentration calculations. A single click of the mouse can perform all desired calculations.
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Focused Ion Beam(FIB)
General Information about FIBs
Applications of FIBs |
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Magnum™ ion column. (18 mm working distance)
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Gas chemistry not only allows you to mill the sample
selectively, but also to reveal oxide layers where conventional SEM
imaging provides no contrast.
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Various Apertures (1pA, 10PA, 30pA, 50pA, 100pA,
300pA, 500pA, 1000pA, 3000pA, 5000pA, 7000pA, 20000pA ) allow for
varied precision of the Ion Mill, and milling into various materials.
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Specialized software allows for TEM sample preparation
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Custom pattern milling designs can be milled
simultaneously or serial.
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Scanning Electron Microscope (SEM)
General Information about SEMs |
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Hexalens™ electron column (5 mm working distance)
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Seaching Magnification up to 500,000 X
Ultra High Resolution Made over 2,500,000 X
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Ultrahigh resolution SEM imaging.
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Optical Microscope |
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Low Magnification optical microscope for tip positioning |
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Interface Computer
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- Windows NT Interface
- Pentium 3 EDAX controller
- CR-ROM
- CR Rewriter
- floppy disk drive
- HP Color Printer
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Codonics NP-1660 network photo paper printer
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